Measurement of Transverse Piezoelectric Coefficients of Pb(Zr0.52Ti0.48)O3 Thin Films by a Mechano-electrical Multiphysics Coupling, Bulge Test Method

Yuandong He, Changzhen Sun, Weiguo Mao*, Yiqi Mao, Honglong Zhang, Yanfei Chen, Yongmao Pei, Daining Fang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

On the measuring of transverse piezoelectric coefficients of Pb(Zr0.52Ti0.48)O3 (PZT) thin films, we derived the mechano-electrical coupling bulge constitutive equations of PZT thin films on the basis of bulge test model and ferroelectric constitutive equations. The bulge samples were prepared by sol-gel and chemical etching methods. Mechano-electrical coupling bulge tests were performed by using modified force-electric experimental platform under the applied voltage between 0-14 V. The results showed that the elastic modulus and residual stress of PZT thin films were 91.9 GPa and 36.2 MPa under pure force field, respectively. The transverse piezoelectric coefficients d31 of PZT thin films increased from -28.9 pm/V to -45.8 pm/V when the voltage increased from 2 V to 14 V. Our work provides an effective analysis method for the transverse piezoelectric properties of other ferroelectric thin film materials by using the modified mechano-electrical coupling bulge test and the corresponding constitutive equations.

Original languageEnglish
Pages (from-to)139-144
Number of pages6
JournalCailiao Daobao/Materials Review
Volume31
Issue number8
DOIs
Publication statusPublished - 10 Aug 2017

Keywords

  • Bulge test
  • Mechano-electrical coupling constitutive equation
  • Pb(ZrTi)-O thin films
  • Transverse piezoelectric coefficient

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