TY - GEN
T1 - Key factors in fiber point diffraction interference technology for measuring surface
AU - Li, Jie
AU - Chen, Lingfeng
PY - 2012
Y1 - 2012
N2 - The point diffraction interferometer (PDI), which generates the nearly ideal spherical wavefront with the pinhole method, is realized the absolute interferometric measurement without the use of reference surface. But it is hard to detect the diameter of the pinhole and hard for use of phase-shifting interferometers in PDI. However the advanced fiber point diffraction interferometer (FPDI) not only replaces the pinhole with the fiber, but also makes it possible to implement phase-shifting and maintain advantage of traditional PDI. In this paper, the different methods of measuring surface are proposed according to different experimental conditions and different targets (such as concave spherical surface, convex spherical surface, flat surface) with the fiber point diffraction interferometer built in the laboratory. Base on these experiments, there are several key factors in the measurement process such as measurement configuration, laser source, polarization beamsplitter, optical fiber. And these factors, affecting the experiment accuracy, were analyzed seriously.
AB - The point diffraction interferometer (PDI), which generates the nearly ideal spherical wavefront with the pinhole method, is realized the absolute interferometric measurement without the use of reference surface. But it is hard to detect the diameter of the pinhole and hard for use of phase-shifting interferometers in PDI. However the advanced fiber point diffraction interferometer (FPDI) not only replaces the pinhole with the fiber, but also makes it possible to implement phase-shifting and maintain advantage of traditional PDI. In this paper, the different methods of measuring surface are proposed according to different experimental conditions and different targets (such as concave spherical surface, convex spherical surface, flat surface) with the fiber point diffraction interferometer built in the laboratory. Base on these experiments, there are several key factors in the measurement process such as measurement configuration, laser source, polarization beamsplitter, optical fiber. And these factors, affecting the experiment accuracy, were analyzed seriously.
KW - Fiber point diffraction
KW - Optical fiber
KW - Optical measurement
KW - Surface measurement
UR - http://www.scopus.com/inward/record.url?scp=81255178536&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/AMM.130-134.4045
DO - 10.4028/www.scientific.net/AMM.130-134.4045
M3 - Conference contribution
AN - SCOPUS:81255178536
SN - 9783037852866
T3 - Applied Mechanics and Materials
SP - 4045
EP - 4048
BT - Mechanical and Electronics Engineering III
T2 - 2011 3rd International Conference on Mechanical and Electronics Engineering, ICMEE 2011
Y2 - 23 September 2011 through 25 September 2011
ER -