Ion beam modification of plasmonic titanium nitride thin films

Lin ao Zhang, Hao nan Liu, Xiao xia Suo, Shou Tong, Ying lan Li, Zhao tan Jiang, Zhi Wang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

Titanium nitride is regarded as an alternative plasmonic material for its tunability and other high performances. In this work, we prepared TiN x thin films by ion beam assisted deposition and studied the effects of assisting ion energy Ea on the structural, electrical, optical, and plasmonic properties of the films. The results show that the bombardment of assisting ions causes higher crystallinity and higher resistivity. Both the experimental and fitting results show that assisting ions can improve the plasmonic performance of TiN x thin films. Higher Ea leads to lower carrier concentration, lower plasma frequency, and lower optical losses. With Ea increasing, the energy loss function shifts toward low photon energy. Importantly, IBAD–TiN x can serve as a promising plasmonic material in visible and near-IR region, and its plasmonic properties can be effectively tuned by assisting ions energy.

Original languageEnglish
Pages (from-to)6442-6448
Number of pages7
JournalJournal of Materials Science
Volume52
Issue number11
DOIs
Publication statusPublished - 1 Jun 2017

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