Hardware implement of high resolution light field microscopy

Xiaoli Jiang, Yao Hu*, Zhuo Chen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Microscope is the primary scientific instrument in many laboratories. Nowadays, with the development of science and technology, requirements on the performance of microscopic imaging are growing rapidly. Light field microscopy (LFM) is an effective approach of obtaining three-dimensional (3D) information. However, the LFM compromises the spatial resolution of image. To solve this problem, this paper proposes a new method by combining LFM with Fourier ptychographic (FP) algorithm, which iteratively stitches together a number of variably illuminated, low-resolution intensity images in Fourier space to produce a wide-field, high-resolution complex sample image. The hardware implement of the system is mainly introduced, which contains the image system and the illumination system. This system uses epi-illumination for non-transparent sample image. To verify the capability of this system, experiments have been done. Firstly, a 150 μm size micro-lens array was used to image without FP algorithm. Secondly, FP algorithm was added to the experiments. Preliminary results showed the potential of the method.

Original languageEnglish
Title of host publicationAOPC 2017
Subtitle of host publication3D Measurement Technology for Intelligent Manufacturing
EditorsAnand Krishna Asundi, Huijie Zhao, Wolfgang Osten
PublisherSPIE
ISBN (Electronic)9781510613973
DOIs
Publication statusPublished - 2017
EventApplied Optics and Photonics China: 3D Measurement Technology for Intelligent Manufacturing, AOPC 2017 - Beijing, China
Duration: 4 Jun 20176 Jun 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10458
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceApplied Optics and Photonics China: 3D Measurement Technology for Intelligent Manufacturing, AOPC 2017
Country/TerritoryChina
CityBeijing
Period4/06/176/06/17

Keywords

  • Fourier ptychographic microscopy
  • High resolution
  • Light field microscopy
  • Microlens array
  • Wide field of view

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