Growth and properties of ITO films on flexible polyimide(PI) substrates

Jing Hu, Zhinong Yu*, Shiyu Zhang, Jianshe Xue, Guanbao Hui, Wei Xue

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Indium tin oxide(ITO)films are prepared on flexible polyimide(PI) substrates by RF magnetron sputtering. The influences of oxygen ratio, sputtering power, working pressure and deposition temperature on the morphology and the photoelectric properties of ITO films are investigated by scanning electron microscope (SEM), X-ray diffraction (XRD), four-probe tester and spectrophotometry. The experiment results reveals that the optimal conditions are sputtering atmosphere of pure argon, sputtering power of 200W, working pressure of 1.5Pa and substrate temperature of 185℃~225℃. Under the optimal condition, the resistivity of 3.64×10-4 Ω·cm and transmittance of 97% are achieved.

Original languageEnglish
Pages (from-to)465-469
Number of pages5
JournalGuangxue Jishu/Optical Technique
Volume40
Issue number5
DOIs
Publication statusPublished - 1 Sept 2014

Keywords

  • Indium-doped tin oxide
  • Polyimide (PI)
  • RF magnetron sputtering
  • Resistivity
  • Transmittance

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