Fractional Fourier ridges for demodulation of interferograms with quadratic phase

Jin Min Wu, Ming Feng Lu*, Chen Chen Ji, Pei Hang Li, Feng Zhang, Ran Tao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

A method based on the fractional Fourier ridges for accurate phase demodulation of a single interferogram with quadratic phase is presented. The interferograms being analyzed may contain circular, elliptic or astigmatic fringes. In signal processing field, such interferograms can be called 2-D chirp-type signals. Since the fractional Fourier transform (FRFT) of a chirp signal is a function under the matched angle that is determined by chirp rates of the signal, so the method can be used to match the multiple chirp rates in chirp-type signals with multiple chirp components. In this work, the FRFT of all row (column) signals are firstly calculated, and the ridge of the FRFT amplitude of each row (column) signal in FRFT domain is recorded. Repeat the above process for each angle of a searching range. Then a ridge tracking approach is employed to determine the matched angle, which can be used to calculate the coefficient of the square term of row (column) coordinates. Moreover, under the matched angle, the ridge of the FRFT amplitude of each row (column) signal all lie on a straight line. The slope and constant term of the line can be used to calculate the coefficient of the linear term of row (column) coordinates and the coefficient of cross term, respectively. The same procedures are implemented to all column (row) signals to determine the coefficients of the square and liner term of column (row) coordinates. According to the obtained coefficients, the phase of the fringe pattern can be constructed without phase unwrapping operation. Furthermore, the present procedure is also capable of analysis of interferograms with or without circularly symmetry fringe distribution instead of using complex and time consuming algorithms for recovering phase from fringe patterns with closed fringes. Finally, the method is tested in simulated and real data.

Original languageEnglish
Title of host publicationModeling Aspects in Optical Metrology VII
EditorsBernd Bodermann, Karsten Frenner
PublisherSPIE
ISBN (Electronic)9781510627932
DOIs
Publication statusPublished - 2019
EventModeling Aspects in Optical Metrology VII 2019 - Munich, Germany
Duration: 24 Jun 201926 Jun 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11057
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceModeling Aspects in Optical Metrology VII 2019
Country/TerritoryGermany
CityMunich
Period24/06/1926/06/19

Keywords

  • Fractional Fourier ridges
  • Fractional Fourier transform
  • Fringe analysis
  • Interferometry
  • Optical metrology
  • Phase recovery

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