@inproceedings{f951213ab38a49dd8c67a4d9682c060f,
title = "Fast calibration for Star test polarimetry via polarization orthogonal basis mapping",
abstract = "Star test polarimeter can map the polarization state of incident light into an intensity distribution of the detection plane by placing a space-variant phase retarder (SVPR) in the pupil plane of an optical system, which can achieve fast acquisition of polarization information of incident light from a single irradiance image. However, subjected by the system's alignment and vibration, star test polarimetry need the calibration scheme with high robustness and fast speed. This paper develops a fast calibration method for Star test polarimetry by measuring three intensity distribution of orthogonal polarization state and an intensity distribution of left-handed circular polarization. Experimental results show that the proposed method, combined with normalized least square (NLS), can rapidly calibrate the theoretical model to accurately measure the polarization state of incident light.",
keywords = "Calibration, Mueller matrix, Polarimetry, Polarization state, Space-variant phase retarder",
author = "Tianlei Ning and Guodong Zhou and Jiazhi Wang and Yanqiu Li",
note = "Publisher Copyright: {\textcopyright} 2021 SPIE.; Optical Technology and Measurement for Industrial Applications Conference 2021 ; Conference date: 20-04-2021 Through 22-04-2021",
year = "2021",
doi = "10.1117/12.2616282",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Takeshi Hatsuzawa and Rainer Tutsch and Toru Yoshizawa",
booktitle = "Optical Technology and Measurement for Industrial Applications Conference 2021",
address = "United States",
}