TY - JOUR
T1 - Fabrication and Electrical Properties of Semi-Conductive h-BNCx Thin Films
AU - Guo, Ning
AU - Wei, Jinquan
AU - Jia, Yi
AU - Sun, Huanhuan
AU - Yang, Dan
AU - Yang, Shengyi
AU - Wang, Yuhang
AU - Zhang, Liuwan
AU - Cao, Anyuan
AU - Zhu, Hongwei
AU - Wang, Kunlin
AU - Wu, Dehai
PY - 2014/3
Y1 - 2014/3
N2 - Two-dimensional thin films with graphene domains embedding in hexagonal boron nitride (h-BNCx) has attractive application due to its tunable energy band gap. In this work, we report a one-step low pressure chemical vapor deposition method to fabricate large-area h-BNCx films without introducing carbon source. The carbon in h-BNCx derives from oil vapor of rotary pump, and it is well controlled by growing parameters, such as growing temperature, annealing time and growth time. It offers a method to fabricate h-BNCx film with low carbon concentration (<20 at.% C). Electron energy loss spectrum shows that boron, nitride and carbon atoms are sp2 hybridized and assemble into atomic layers. X-ray photoelectron spectra characterization further reveals that the h-BNCx has a hybridized structure with graphene domains embedding in h-BN layers. The intensity ratio of G-band and D-band in Raman spectra could be used to characterize the carbon content in h-BNCx film qualitatively. The band gap and electrical properties of the h-BNCx is tailored by the carbon concentration. The carrier mobility, resistivity perpendicular and parallel to the h-BNCx film are 5.1×10-2 cm2.V-1.s-1, 55 k Ω cm and 12.6 MΩ cm for the samples with carbon concentration of 20.2 at.%, respectively.
AB - Two-dimensional thin films with graphene domains embedding in hexagonal boron nitride (h-BNCx) has attractive application due to its tunable energy band gap. In this work, we report a one-step low pressure chemical vapor deposition method to fabricate large-area h-BNCx films without introducing carbon source. The carbon in h-BNCx derives from oil vapor of rotary pump, and it is well controlled by growing parameters, such as growing temperature, annealing time and growth time. It offers a method to fabricate h-BNCx film with low carbon concentration (<20 at.% C). Electron energy loss spectrum shows that boron, nitride and carbon atoms are sp2 hybridized and assemble into atomic layers. X-ray photoelectron spectra characterization further reveals that the h-BNCx has a hybridized structure with graphene domains embedding in h-BN layers. The intensity ratio of G-band and D-band in Raman spectra could be used to characterize the carbon content in h-BNCx film qualitatively. The band gap and electrical properties of the h-BNCx is tailored by the carbon concentration. The carrier mobility, resistivity perpendicular and parallel to the h-BNCx film are 5.1×10-2 cm2.V-1.s-1, 55 k Ω cm and 12.6 MΩ cm for the samples with carbon concentration of 20.2 at.%, respectively.
KW - Doping
KW - Electrical Property
KW - Hexagonal Boron Nitride
KW - Raman
UR - http://www.scopus.com/inward/record.url?scp=84894237885&partnerID=8YFLogxK
U2 - 10.1166/sam.2014.1732
DO - 10.1166/sam.2014.1732
M3 - Article
AN - SCOPUS:84894237885
SN - 1947-2935
VL - 6
SP - 550
EP - 557
JO - Science of Advanced Materials
JF - Science of Advanced Materials
IS - 3
ER -