Fabrication and Electrical Properties of Semi-Conductive h-BNCx Thin Films

Ning Guo, Jinquan Wei*, Yi Jia, Huanhuan Sun, Dan Yang, Shengyi Yang, Yuhang Wang, Liuwan Zhang, Anyuan Cao, Hongwei Zhu, Kunlin Wang, Dehai Wu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Two-dimensional thin films with graphene domains embedding in hexagonal boron nitride (h-BNCx) has attractive application due to its tunable energy band gap. In this work, we report a one-step low pressure chemical vapor deposition method to fabricate large-area h-BNCx films without introducing carbon source. The carbon in h-BNCx derives from oil vapor of rotary pump, and it is well controlled by growing parameters, such as growing temperature, annealing time and growth time. It offers a method to fabricate h-BNCx film with low carbon concentration (<20 at.% C). Electron energy loss spectrum shows that boron, nitride and carbon atoms are sp2 hybridized and assemble into atomic layers. X-ray photoelectron spectra characterization further reveals that the h-BNCx has a hybridized structure with graphene domains embedding in h-BN layers. The intensity ratio of G-band and D-band in Raman spectra could be used to characterize the carbon content in h-BNCx film qualitatively. The band gap and electrical properties of the h-BNCx is tailored by the carbon concentration. The carrier mobility, resistivity perpendicular and parallel to the h-BNCx film are 5.1×10-2 cm2.V-1.s-1, 55 k Ω cm and 12.6 MΩ cm for the samples with carbon concentration of 20.2 at.%, respectively.

Original languageEnglish
Pages (from-to)550-557
Number of pages8
JournalScience of Advanced Materials
Volume6
Issue number3
DOIs
Publication statusPublished - Mar 2014

Keywords

  • Doping
  • Electrical Property
  • Hexagonal Boron Nitride
  • Raman

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