Differentiable freeform lens design for irradiance tailoring on tilted target plane

Haisong Tang, Zexin Feng*, Yi Luo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Here focus on freeform lens design for irradiance tailoring on tilted target planes based on differentiable ray tracing. Leveraging the computational graph, we develop a differentiable Monte Carlo ray tracing framework featuring a 3D coordinate rotation operator. The forward calculation within this framework can simulate the irradiance distribution on a tilted target plane generated by a freeform lens, facilitating the assessment of deviations from the desired irradiance distribution. The back-propagation efficiently acquires surface parameter gradients for optimization through the Adam optimizer. The design example demonstrates that the proposed method can effectively generate a high-quality uniform irradiance distribution on a tilted receiver.

Original languageEnglish
Title of host publicationOptical Design and Testing XIV
EditorsYongtian Wang, Tina E. Kidger, Rengmao Wu
PublisherSPIE
ISBN (Electronic)9781510682023
DOIs
Publication statusPublished - 2024
EventOptical Design and Testing XIV 2024 - Nantong, China
Duration: 13 Oct 202415 Oct 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13237
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Design and Testing XIV 2024
Country/TerritoryChina
CityNantong
Period13/10/2415/10/24

Keywords

  • LED illumination
  • differentiable ray tracing
  • freeform lens

Fingerprint

Dive into the research topics of 'Differentiable freeform lens design for irradiance tailoring on tilted target plane'. Together they form a unique fingerprint.

Cite this

Tang, H., Feng, Z., & Luo, Y. (2024). Differentiable freeform lens design for irradiance tailoring on tilted target plane. In Y. Wang, T. E. Kidger, & R. Wu (Eds.), Optical Design and Testing XIV Article 132370Q (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 13237). SPIE. https://doi.org/10.1117/12.3033378