Determining the Charge of Vortex Beams by Focused Intensity After Polarization Modulated

Xuebing Dai, Yanqiu Li*, Lihui Liu, Ke Liu, Meng Zheng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Optical vortex beams (VB) carrying orbital angular momentum is of great importance in many fields. In this letter, combining a polarization modulation system and high NA lens, we propose a new method for detecting the topological charge (TC) value of VB. According to the focal field intensity distribution of VB after polarization modulation, we explore the correlation between the intensity and the TC of VB. The results reveal that the tightly focusing intensity represents a smallest solid spot when the TC value of VB equals the polarization azimuthal index. Based on this property, we can determine arbitrary states of VB by the focal intensity, especially in the case of higher charge.

Original languageEnglish
Pages (from-to)487-490
Number of pages4
JournalIEEE Photonics Technology Letters
Volume30
Issue number5
DOIs
Publication statusPublished - 1 Mar 2018

Keywords

  • Vortex beams
  • diffraction
  • focusing
  • polarization

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Dai, X., Li, Y., Liu, L., Liu, K., & Zheng, M. (2018). Determining the Charge of Vortex Beams by Focused Intensity After Polarization Modulated. IEEE Photonics Technology Letters, 30(5), 487-490. https://doi.org/10.1109/LPT.2018.2797986