Deformation measurement of nanotubes by tern nano-moire method

Hai Xia Shang*, Hui Min Xie, Hong Wei Zhu, Fu Long Dai, Zhan Wei Liu, De Hai Wu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The TEM nano-moire method is first applied to measure the mechanical properties of single-walled nanotubes. The nano-moire method is an experimental technique, which allows direct measurement to nanoscopic mechanical parameters. The moire pattern is generated by the interference between scanning lines in monitor and transmission electron microscopy (TEM) image of self-assembled SWNTs bundles. The principle of the technique is described in detail. The SWNT bundles with different diameters produced by arc-discharge method are used to generate moire patterns. The TEM nano-moire method is successfully used to measure the residual deformation of an individual nanotube with diameter of 1.0 nm in a curved SWNT bundle. The results demonstrate the feasibility of this technique.

Original languageEnglish
Pages (from-to)515-517
Number of pages3
JournalGuangxue Jishu/Optical Technique
Volume29
Issue number5
Publication statusPublished - Sept 2003
Externally publishedYes

Keywords

  • Mechanical properties
  • Residual deformation
  • SWNTs
  • TEM nano-moire method

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