@inproceedings{2edef2a127794116a91b75d394a79b65,
title = "Control of surface ablation on fused silica with ultrafast laser double-pulse based on seed electrons dynamics control",
abstract = "The influence of pulse-separation (τs) between a pair of temporally separated femtosecond laser pulses (with near ablation-threshold energy) on surface ablation of SiO2 were experimentally studied. A τs range of τs≤20 ps was considered. It was shown that a τs-independent/-dependent crater ablation area can be flexibly controlled. Once the pulse energy of the pulse pair exceeds a threshold value, crater ablation area become quasi-τ,s-independent at τs> ∼1 ps. This τs-independent phenomenon can even be observed when each pulse within the double-pulse pair has a sub-threshold energy, which leads to a further reduction in ablation size. The experimental findings have not only confirmed our previous calculation based on a modified model, but also greatly extended the results both quantitatively and qualitatively. A dominant amount of seed electron from photoionization of self-trapped excitons (STEs) is responsible for the appearance of τs-independent phenomena. For physical interest, it is inferred that destruction of STEs will tend to break the τs-independent ablation phenomena. Experiments performed on CdWO4, a material exhibiting similar electron dynamics to that in SiO2 but a faster decay in STE population, support this conjecture. A possible improvement for the relevant theoretical modeling is also suggested based on the experimental findings.",
keywords = "Ablation threshold, Double pulse, Femtosecond laser, Ionization, Pulse shaping, Seed electrons",
author = "Zhang, {K. H.} and X. Li and Rong, {W. L.} and P. Ran and B. Li and P. Feng and Yang, {Q. Q.}",
note = "Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; Applied Optics and Photonics, China: Micro/Nano Optical Manufacturing Technologies; and Laser Processing and Rapid Prototyping Techniques, AOPC 2015 ; Conference date: 05-05-2015 Through 07-05-2015",
year = "2015",
doi = "10.1117/12.2202346",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Minghui Hong and Lin Li and Lan Jiang",
booktitle = "AOPC 2015",
address = "United States",
}