TY - GEN
T1 - Calibration of the astigmatism errors induced by misalignment of quadri-wave lateral shearing interferometer
AU - Si, Yiwei
AU - Liu, Ke
AU - Li, Yanqiu
AU - Qin, Peng
AU - Zhong, Hui
N1 - Publisher Copyright:
© 2021 SPIE.
PY - 2021
Y1 - 2021
N2 - Error calibration is one of the most important factors to realize the quadri-wave lateral shearing interferometer (QWLSI) with high accuracy. The misalignment errors of QWLSI, such as the tilt of grating and the tilt of charge coupled device (CCD), will affect the measurement accuracy. The astigmatism errors induced by the tilt of grating and CCD during the alignment process of QWLSI, which are neglected in previous studies, are analyzed and presented in analytical expressions in this paper. Firstly, the additional phase difference in X and Y directions induced by the tilt of grating and CCD are analyzed using the optical wave interference theory. Representing the phase difference in the two directions and the test wavefront with the combinations of Zernike polynomials respectively, we further obtain the analytical expressions between the Zernike coefficients of the phase difference and the Zernike coefficients of the test wavefront, according to the wavefront reconstruction theory. Then the analytical expressions for the measurement errors induced by the tilt of grating and CCD, which are mainly astigmatism, can be obtained. The analytical results show that the misalignment induced astigmatism errors are inversely proportional to the shearing ratio and proportional to the tilt angle of grating and CCD. The alignment experiment of a home-made QWLSI under null test condition is conducted to verify the correctness of the theoretical analysis. With different shearing ratios for the QWLSI, the astigmatism errors, which are induced by the tilt of grating in experimental results, are consistent with the theoretical analysis results. This paper can provide technical support for the alignment of QWLSI with small shearing ratio and high precision.
AB - Error calibration is one of the most important factors to realize the quadri-wave lateral shearing interferometer (QWLSI) with high accuracy. The misalignment errors of QWLSI, such as the tilt of grating and the tilt of charge coupled device (CCD), will affect the measurement accuracy. The astigmatism errors induced by the tilt of grating and CCD during the alignment process of QWLSI, which are neglected in previous studies, are analyzed and presented in analytical expressions in this paper. Firstly, the additional phase difference in X and Y directions induced by the tilt of grating and CCD are analyzed using the optical wave interference theory. Representing the phase difference in the two directions and the test wavefront with the combinations of Zernike polynomials respectively, we further obtain the analytical expressions between the Zernike coefficients of the phase difference and the Zernike coefficients of the test wavefront, according to the wavefront reconstruction theory. Then the analytical expressions for the measurement errors induced by the tilt of grating and CCD, which are mainly astigmatism, can be obtained. The analytical results show that the misalignment induced astigmatism errors are inversely proportional to the shearing ratio and proportional to the tilt angle of grating and CCD. The alignment experiment of a home-made QWLSI under null test condition is conducted to verify the correctness of the theoretical analysis. With different shearing ratios for the QWLSI, the astigmatism errors, which are induced by the tilt of grating in experimental results, are consistent with the theoretical analysis results. This paper can provide technical support for the alignment of QWLSI with small shearing ratio and high precision.
KW - Misalignment errors
KW - Shearing interferometer
KW - Shearing ratio
KW - Wavefront measurement
KW - Wavefront reconstruction
UR - http://www.scopus.com/inward/record.url?scp=85120503579&partnerID=8YFLogxK
U2 - 10.1117/12.2616277
DO - 10.1117/12.2616277
M3 - Conference contribution
AN - SCOPUS:85120503579
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Technology and Measurement for Industrial Applications Conference 2021
A2 - Hatsuzawa, Takeshi
A2 - Tutsch, Rainer
A2 - Yoshizawa, Toru
PB - SPIE
T2 - Optical Technology and Measurement for Industrial Applications Conference 2021
Y2 - 20 April 2021 through 22 April 2021
ER -