A Variable-Bandwidth Extended State Observer for Nonlinear Systems With Measurement Noise

Bing Cui, Guotao Zhao, Yuanqing Xia*, Pengcheng Wang*, Yonghe Zhang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

In this article, a novel variable-bandwidth extended state observer (VBESO) is proposed to estimate external disturbances for a class of nth-order nonlinear systems with measurement noise. Based on the feature of "high error, high bandwidth; low error, low bandwidth,"the bandwidth of the proposed observer is adjusted automatically with the output estimation error, achieving a tradeoff between the estimation accuracy and the robustness to measurement noise. Moreover, a designed filter is introduced into the observer such that an arbitrarily small initial bandwidth can be set to alleviate the "peaking phenomenon,"and the convergence speed is improved by reducing the time constant of the filter. In addition, extensions to other kinds of observers are also established. Finally, the VBESO-based state-feedback control is presented and applied to the drag-free spacecraft hardware-in-loop experiment platform. Simulation and experiment results show that the proposed VBESO can improve the tolerance to the measurement noise and achieve a tradeoff between transient-state and steady-state performance.

Original languageEnglish
Pages (from-to)1946-1957
Number of pages12
JournalIEEE Transactions on Industrial Electronics
Volume72
Issue number2
DOIs
Publication statusPublished - 2025

Keywords

  • Drag-free spacecraft (SC) system
  • extended state observer (ESO)
  • measurement noise
  • state-feedback control
  • variable bandwidth

Fingerprint

Dive into the research topics of 'A Variable-Bandwidth Extended State Observer for Nonlinear Systems With Measurement Noise'. Together they form a unique fingerprint.

Cite this

Cui, B., Zhao, G., Xia, Y., Wang, P., & Zhang, Y. (2025). A Variable-Bandwidth Extended State Observer for Nonlinear Systems With Measurement Noise. IEEE Transactions on Industrial Electronics, 72(2), 1946-1957. https://doi.org/10.1109/TIE.2024.3419254