A novel absolute phase retrieval method requiring only three projected patterns

Lin Fan, Shaohui Zhang*, Yao Hu, Qun Hao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In fringe projection profilometry, phase unwrapping has long been a critical issue. Unwrapping methods can be classified as spatial unwrapping methods and temporal unwrapping methods. The spatial unwrapping method applies only to the surface of continuous objects. The temporal unwrapping method is more widely used and can be used on discontinuous or isolated objects. Nevertheless, the temporal unwrapping methods are suffering from time-consuming, such as the large number of pictures required (standard temporal unwrapping method, phase shift plus Gray code method), and high algorithm complexity (such as periodic encoding method, Fourier transform Method) Etc. Therefore, we propose a temporal unwrapping method using only three projection patterns. In this method, two linear gray scale increasing and decreasing pictures are used to obtain the cores global phase map and uniform illumination background. Another sine fringe image and the above uniformly illuminated background image are used to obtain the wrapped phase. Then the absolute phase can be achieved with the coarse global phase distribution and the wrapped phase. Experimental results prove that this method can measure three-dimensional scenes containing isolated objects.

Original languageEnglish
Title of host publicationOptical Metrology and Inspection for Industrial Applications VII
EditorsSen Han, Gerd Ehret, Benyong Chen
PublisherSPIE
ISBN (Electronic)9781510639195
DOIs
Publication statusPublished - 2020
EventOptical Metrology and Inspection for Industrial Applications VII 2020 - Virtual, Online, China
Duration: 11 Oct 202016 Oct 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11552
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Metrology and Inspection for Industrial Applications VII 2020
Country/TerritoryChina
CityVirtual, Online
Period11/10/2016/10/20

Keywords

  • 3D measurement
  • Fringe projection profilometry
  • Hilbert transform
  • Phase unwrapping

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