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Weak infrared radiation intensity measurement based on extended Duffing oscillator
Yongming Zhao, Jian Du,
Xin Wang
*
, Chang Liu, Zhuo Li, Yan Hao
*
此作品的通讯作者
光电学院
Beijing Institute of Technology
Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology
Beijing Simulation Center
科研成果
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书/报告/会议事项章节
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会议稿件
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同行评审
1
引用 (Scopus)
综述
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探究 'Weak infrared radiation intensity measurement based on extended Duffing oscillator' 的科研主题。它们共同构成独一无二的指纹。
分类
加权
按字母排序
Engineering
Infrared Radiation
100%
Radiation Intensity
100%
Signal-to-Noise Ratio
33%
Signal Modulation
33%
Processing Method
33%
Measurement System
16%
Measurement Error
16%
Frequency Domain
16%
Potential Application
16%
Delay Time
16%
Photodetector
16%
Choppers (Circuits)
16%
Measurement Setup
16%
Radiation Power
16%
Physics
Infrared Radiation
100%
Radiant Flux Density
100%
Signal-to-Noise Ratio
33%
Signal Modulation
33%
Photometer
16%