Verification and test system technology for CMOS-MEMS switches

Liu Peng, Wenzhong Lou, Dai Ximing, Lu Yufei

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

A high-performance, low-cost test equipment system for characterization of MEMS switch is to be proposed in this paper, and the purpose is set to master the fundament of the embedded algorithms of the wafer and system production testing. The team has implemented the real-time analysis for MEMS switch, proving the feasibility of the design, based on the original data collected during the dedicated tests, applying the microsystem hardware designed and assembled by the research team, as well as the embedded software. At the end, the framework of the system platform in the future is described.

源语言英语
主期刊名2015 IEEE 10th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015
出版商Institute of Electrical and Electronics Engineers Inc.
585-588
页数4
ISBN(电子版)9781467366953
DOI
出版状态已出版 - 1 7月 2015
活动10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015 - Xi'an, 中国
期限: 7 4月 201511 4月 2015

出版系列

姓名2015 IEEE 10th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015

会议

会议10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015
国家/地区中国
Xi'an
时期7/04/1511/04/15

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