Ultrasonic inspection method for residual stress gradient distribution

Yuren Lu, Erhong Li, Chunguang Xu, Xiaohui Zhang, Xiaoxia Li

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The gradient distribution of the residual stress inside the component is the key factor that affects the performance of all aspects of the component. There has been a lack of effective mechanism research in the use of ultrasonic critical refracted longitudinal waves to detect the gradient residual stress. This paper studies the propagation of critically refracted longitudinal waves in solids at different frequencies, and analyzes and studies the acoustoelastic effects of critically refracted longitudinal waves from the perspective of elastic waves. Aiming at the relationship between the center frequency of LCR and its propagation depth, a mathematical model of stress gradient detection is established. The correctness of the acoustic elasticity theory and the theoretical basis of critical refraction longitudinal wave is verified by simulation. The energy depth of LCR wave propagation at different frequencies is simulated by changing the center frequency of LCR wave. The scale was verified to verify the correctness of the mathematical model of residual stress gradient detection.

源语言英语
主期刊名Proceedings of 2021 IEEE Far East NDT New Technology and Application Forum, FENDT 2021
编辑Chunguang Xu
出版商Institute of Electrical and Electronics Engineers Inc.
208-212
页数5
ISBN(电子版)9781665401593
DOI
出版状态已出版 - 2021
活动2021 IEEE Far East NDT New Technology and Application Forum, FENDT 2021 - Kunming, 中国
期限: 15 12月 202116 12月 2021

出版系列

姓名Proceedings of 2021 IEEE Far East NDT New Technology and Application Forum, FENDT 2021

会议

会议2021 IEEE Far East NDT New Technology and Application Forum, FENDT 2021
国家/地区中国
Kunming
时期15/12/2116/12/21

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引用此

Lu, Y., Li, E., Xu, C., Zhang, X., & Li, X. (2021). Ultrasonic inspection method for residual stress gradient distribution. 在 C. Xu (编辑), Proceedings of 2021 IEEE Far East NDT New Technology and Application Forum, FENDT 2021 (页码 208-212). (Proceedings of 2021 IEEE Far East NDT New Technology and Application Forum, FENDT 2021). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/FENDT54151.2021.9749665