Three-dimensional displacement measurement of image point by point-diffraction interferometry

Xiao He, Lingfeng Chen, Xiaojie Meng, Lei Yu

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

This paper presents a method for measuring the three-dimensional (3-D) displacement of an image point based on point-diffraction interferometry. An object Point-light-source (PLS) interferes with a fixed PLS and its interferograms are captured by an exit pupil. When the image point of the object PLS is slightly shifted to a new position, the wavefront of the image PLS changes. And its interferograms also change. Processing these figures (captured before and after the movement), the wavefront difference of the image PLS can be obtained and it contains the information of three-dimensional (3-D) displacement of the image PLS. However, the information of its three-dimensional (3-D) displacement cannot be calculated until the distance between the image PLS and the exit pupil is calibrated. Therefore, we use a plane-parallel-plate with a known refractive index and thickness to determine this distance, which is based on the Snell's law for small angle of incidence. Thus, since the distance between the exit pupil and the image PLS is a known quantity, the 3-D displacement of the image PLS can be simultaneously calculated through two interference measurements. Preliminary experimental results indicate that its relative error is below 0.3%. With the ability to accurately locate an image point (whatever it is real or virtual), a fiber point-light-source can act as the reticle by itself in optical measurement.

源语言英语
主期刊名2017 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems
编辑Kexin Xu, Hai Xiao, Jigui Zhu, Hwa-Yaw Tam
出版商SPIE
ISBN(电子版)9781510617537
DOI
出版状态已出版 - 2018
活动2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Beijing, 中国
期限: 28 10月 201730 10月 2017

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10621
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
国家/地区中国
Beijing
时期28/10/1730/10/17

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引用此

He, X., Chen, L., Meng, X., & Yu, L. (2018). Three-dimensional displacement measurement of image point by point-diffraction interferometry. 在 K. Xu, H. Xiao, J. Zhu, & H.-Y. Tam (编辑), 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems 文章 1062106 (Proceedings of SPIE - The International Society for Optical Engineering; 卷 10621). SPIE. https://doi.org/10.1117/12.2292028