Temperature-dependent defect accumulation and evolution in Ni-irradiated NiFe concentrated solid-solution alloy

Zhe Fan, Gihan Velisa, Ke Jin, Miguel L. Crespillo, Hongbin Bei, William J. Weber, Yanwen Zhang*

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

17 引用 (Scopus)

摘要

Temperature significantly affects defect migration and evolution in irradiated materials. However, the effects of temperature on defect evolution in concentrated solid-solution alloys (CSAs), including high entropy alloys, are not well understood, despite their potential as structural materials in advanced nuclear reactors. As an important model system of these CSAs, equiatomic Ni 50 Fe 50 (NiFe) was selected to understand the effects of temperature on defect evolution during irradiation and subsequent thermal annealing. Specifically, defect accumulation and evolution in NiFe alloy under Ni-ion irradiation at 150, 300, and 500 K were studied, and the irradiated specimens were subsequently annealed at higher temperatures. Rutherford backscattering spectrometry along the <100> channeling direction was employed to study damage accumulation and evolution before and after each irradiation and annealing experiment. Here we show that more defects survive and accumulate at 150 K, but more importantly defects can migrate to deeper depths at this low irradiation temperature. Irradiation-induced damage at 150 and 300 K does not recover substantially after post-irradiation annealing at 500 K, but dramatic recovery is observed after post-irradiation annealing at 700 K, indicating an onset temperature of defect recovery between 500 and 700 K. The migration of irradiation-induced defects upon annealing is closely related to the mobility and stress state arising from the surviving defects. With the consideration of five stages of defect recovery in conventional dilute alloys, the underlying mechanisms for temperature-dependent defect accumulation and evolution in NiFe CSA are discussed.

源语言英语
页(从-至)1-9
页数9
期刊Journal of Nuclear Materials
519
DOI
出版状态已出版 - 6月 2019
已对外发布

指纹

探究 'Temperature-dependent defect accumulation and evolution in Ni-irradiated NiFe concentrated solid-solution alloy' 的科研主题。它们共同构成独一无二的指纹。

引用此