Study on the Reliability Index System of Nuclear Power System

Guangliang Chen, Huina Mu, Xiaojian Yi, Yuanyuan Yang, Hongmei Yan

科研成果: 书/报告/会议事项章节会议稿件同行评审

3 引用 (Scopus)
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摘要

The requirements, principles and steps of building reliability index system of the nuclear power system are proposed in this paper. First, due to the particularity of the nuclear power system, its reliability index system must meet the requirements of any different person, different levels, different factors and general engineering. Then, the principles of integrity, coordination, necessity, consistency, operability, industry characteristics and standardability should be met when establishing the reliability index system of the nuclear power system. Finally, the construction of the reliability index system of nuclear power system should follow the correct steps. The Control Rod Drive Mechanism (CRDM) is taken as an example to construct the reliability index system in this paper, which lays a foundation for the allocation and prediction of reliability indicators.

源语言英语
主期刊名Proceedings - 2019 Prognostics and System Health Management Conference, PHM-Paris 2019
编辑Chuan Li, Jose Valente de Oliveira, Ping Ding, Ping Ding, Diego Cabrera
出版商Institute of Electrical and Electronics Engineers Inc.
125-129
页数5
ISBN(电子版)9781728103297
DOI
出版状态已出版 - 5月 2019
活动2019 Prognostics and System Health Management Conference, PHM-Paris 2019 - Paris, 法国
期限: 2 5月 20195 5月 2019

出版系列

姓名Proceedings - 2019 Prognostics and System Health Management Conference, PHM-Paris 2019

会议

会议2019 Prognostics and System Health Management Conference, PHM-Paris 2019
国家/地区法国
Paris
时期2/05/195/05/19

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引用此

Chen, G., Mu, H., Yi, X., Yang, Y., & Yan, H. (2019). Study on the Reliability Index System of Nuclear Power System. 在 C. Li, J. V. de Oliveira, P. Ding, P. Ding, & D. Cabrera (编辑), Proceedings - 2019 Prognostics and System Health Management Conference, PHM-Paris 2019 (页码 125-129). 文章 8756345 (Proceedings - 2019 Prognostics and System Health Management Conference, PHM-Paris 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PHM-Paris.2019.00029