Study on fault diagnostic strategy of intelligent magnetic detection microsystems

Yongqiang Wang, Wenzhong Lou*, Ningjun Fan, Jianwei Hao, Dayin Zhang

*此作品的通讯作者

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6 引用 (Scopus)
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摘要

Intelligent Magnetic Detection Microsystems (IMDM) are complex microsystems, which are used to obtain the information of motor flux and speed in single-driveway traffic system; the microsystems have to fulfill the task in a harsh environment of field, which would infect the reliability of system. An effective method to ensure maintenance cost and reliability is to integrate efficient built-in-test and monitoring function into IMDM, so testability analysis is introduced in the design of Microsystems. The Microsystems testing-points and diagnostic strategy are reasonably identified, which are beneficial to implement the rapid detection and fault isolation. This paper presents an approach to construct a fault message matrix based on the functional block diagram and signal flow chart of the microsystems. By analyzing the contribution of the testing-points to fault detection and fault isolation, the matrix is resolved step by step, the most necessary testing-points are identified and optimal diagnostic strategy is determined. Thus, the purpose of fault detection and fault isolation is achieved by the use of the fewest testing-points and short time.

源语言英语
页(从-至)89-94
页数6
期刊Microsystem Technologies
15
1 SPEC. ISS.
DOI
出版状态已出版 - 1月 2009

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Wang, Y., Lou, W., Fan, N., Hao, J., & Zhang, D. (2009). Study on fault diagnostic strategy of intelligent magnetic detection microsystems. Microsystem Technologies, 15(1 SPEC. ISS.), 89-94. https://doi.org/10.1007/s00542-008-0674-4