Structure evolution of the interfacial layer of BaTiO3 thin films during annealing process and related good resistive switching behaviors
Zixiong Sun*, Sizhao Huang*, Wenxuan Zhu, Yorick A. Birkhölzer, Xing Gao, Romar Angelo Avila, Houbing Huang*, Xiaojie Lou, Evert P. Houwman, Minh D. Nguyen*, Gertjan Koster, Guus Rijnders*
*此作品的通讯作者
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