SMD reliability research base on Stolkarts fatigue model

Zhao Wang*, Heming Zhao, Wenzhong Lou, Hanwei Li, Li Jin

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The article mainly focus on the reliability of the solder joints between the PCB and SMD in the situation like transporting and restoring, etc, provide theory evidence to enhance the reliability of such devices, ANSYS simulation tool serviced for modeling PCB, SMD and the joint structures, analyzed the maximum and the minimum stress position of the model, lower stress was loaded on the model to simulate the transferring action, then based on the Stolkarts fatigue model to predict the lifetime of these components, calculated the theory lifetime of the model, compared with the experiment, finally proved that Stolkarts fatigue model has actual ability to calculate the lifetime of devices which under certain stress value.

源语言英语
主期刊名ICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging
673-676
页数4
DOI
出版状态已出版 - 2011
活动2011 12th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2011 - Shanghai, 中国
期限: 8 8月 201111 8月 2011

出版系列

姓名ICEPT-HDP 2011 Proceedings - 2011 International Conference on Electronic Packaging Technology and High Density Packaging

会议

会议2011 12th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2011
国家/地区中国
Shanghai
时期8/08/1111/08/11

指纹

探究 'SMD reliability research base on Stolkarts fatigue model' 的科研主题。它们共同构成独一无二的指纹。

引用此