Sensitization and desensitization of PBXs stemming from microcrack and microvoid in responses to pressure-time loading

Kun Yang, Yanqing Wu*, Hongzheng Duan, Fenglei Huang

*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

9 引用 （Scopus）

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