Research on high-temperature permittivity and loss tangent of low-loss dielectric by resonant-cavity technique

Maosheng Cao*, Zhiling Hou, Xiaoling Shi, Fuchi Wang

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

5 引用 (Scopus)

摘要

Resonant-cavity technique was introduced to measure the permittivity and loss tangent of low-loss dielectrics. The dielectric properties at 9-10 GHz are measured accurately at the temperature up to 800°C by the resonant cavity technique. The only electrical parameters that need to be measured are quality factors (Q) and resonant length (L) of resonant cavity loaded and unloaded with dielectric sample. Moreover, the error caused by thermal expansion effect was resolved by error analysis and experimental calibration.

源语言英语
页(从-至)279-282
页数4
期刊High Technology Letters
13
3
出版状态已出版 - 9月 2007

指纹

探究 'Research on high-temperature permittivity and loss tangent of low-loss dielectric by resonant-cavity technique' 的科研主题。它们共同构成独一无二的指纹。

引用此