Real-time in situ observation of extended defect evolution near a crack tip in GaSb crystal under thermal loading

Engineering

• Crack Tip 100%
• Situ Observation 100%
• Extended Defect 100%
• Buffer Layer 33%
• Transmissions 16%
• High Resolution 16%
• Room Temperature 16%
• Driving Force 16%
• Nanometre 16%
• Thermal Stress 16%
• Heating Process 16%
• Stress Field 16%
• Superlattice 16%
• Semiconductor Material 16%
• Field Result 16%
• Crack Width 16%

Material Science

• Crack Tip 100%
• Buffer Layer 66%
• Nucleation 66%
• Amorphous Material 33%
• Single Crystal 33%
• Molecular Beam Epitaxy 33%
• Scanning Transmission Electron Microscopy 33%
• Semiconductor Material 33%
• Superlattice 33%
• Thermal Stress 33%
• Stress Field 33%