Profile measurement of large aspheric optical surface by scanning deflectometry with rotatable mirror - Method for enlarging measuring range of autocollimator

Muzheng Xiao*, Satomi Jujo, Satoru Takahashi, Kiyoshi Takamasu

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

1 引用 (Scopus)

摘要

Interferometers are widely used for measuring large reflecting flat surfaces and spherical surfaces because of its high accuracy and high efficiency. Because interferometry needs standard reference surface for measurement, when measuring a large aspheric surface it needs null lens or hologram to make an aspheric wave front. However, if the perfect profile of the aspheric surface is not known before test, interferometry cannot be used to measure. When measuring a large flat, deflectometry is also proposed and proved to have high precision of sub-nanometers. However, it cannot be used because of the limit of the measuring range of the autocollimator. We proposed a new scanning deflectometry method using an autocollimator and a rotatable mirror fixed on a scanning stage. The rotatable mirror and a fixed mirror are supposed to have the same function as a pentagon prism which can eliminate the pitching angle error of the scanning stage as it moves. We scan slope of the aspheric mirror by autocollimator, and when the angle becomes close to exceeding the measureable range of the autocollimator, the rotatable mirror is turned a certain angle to fit the slope of the aspheric mirror and continue scanning. The error analysis of the method is done, and the result show that if the condition is well controlled the uncertainty of this method is 10nm. Pre-experiments is done, which proved that the rotatable scanning mechanism is able to eliminate pitching error of the scanning stage.

源语言英语
主期刊名10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010
172-175
页数4
出版状态已出版 - 2010
已对外发布
活动10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010 - Osaka, 日本
期限: 5 9月 20109 9月 2010

出版系列

姓名10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010

会议

会议10th International Symposium on Measurement and Quality Control 2010, ISMQC 2010
国家/地区日本
Osaka
时期5/09/109/09/10

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