Proceedings of SPIE: Optical Design and Testing III: Introduction

Wang Yongtian; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno

doi:10.1117/12.784992

Proceedings of SPIE: Optical Design and Testing III: Introduction

Wang Yongtian, Theo T. Tschudi, Jannick P. Rolland, Kimio Tatsuno

光电学院

科研成果: 期刊稿件 › 社论

源语言	英语
文章编号	683401
页（从-至）	XIX-XX
期刊	Proceedings of SPIE - The International Society for Optical Engineering
卷	6834
DOI	https://doi.org/10.1117/12.784992
出版状态	已出版 - 2008
活动	Optical Design and Testing III - Beijing, 中国期限: 12 11月 2007 → 15 11月 2007

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10.1117/12.784992

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引用此

Yongtian, W., Tschudi, T. T., Rolland, J. P., & Tatsuno, K. (2008). Proceedings of SPIE: Optical Design and Testing III: Introduction. Proceedings of SPIE - The International Society for Optical Engineering, 6834, XIX-XX. 文章 683401. https://doi.org/10.1117/12.784992

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