Preparation and ferroelectric properties of double-scale PZT composite piezoelectric thick film

Zhong Xia Duan, Jie Yuan, Quan Liang Zhao, Hong Mei Liu, Hai Bo Lin, Wen Tong Zhang, Mao Sheng Cao*

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

21 引用 (Scopus)

摘要

Dense and crack-free double-scale lead zirconate titanate (Pb(Zr 0.52Ti0.48)O3, PZT) composite piezoelectric thick films have been successfully fabricated on Au/Cr/SiO2/Si substrates by a modified sol-gel method. The XRD analysis indicates that the thick film possesses a single-phase perovskite-type structure. The SEM micrograph shows that the surface is crack-free and the cross section is dense and clear. The thickness of the PZT thick film is about 4 μm. It also exhibits good ferroelectric properties, and has high direct current compression resistant properties. At the test frequency of 1kHz, the film has the coercive field of 50 kV/cm, the saturation polarization of 54 μC/cm2 and the remnant polarization of 30 μC/cm2.

源语言英语
页(从-至)1472-1475
页数4
期刊Chinese Physics Letters
25
4
DOI
出版状态已出版 - 1 4月 2008

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