Nanometer profile measurement of aspheric surface using scanning deflectometry and rotating autocollimator: Self-calibration method of autocollimator

Kiyoshi Takamasu; Kyohei Ishikawa; Tomihiko Takamura; Muzheng Xiao; Satoru Takahashi

Nanometer profile measurement of aspheric surface using scanning deflectometry and rotating autocollimator: Self-calibration method of autocollimator

Kiyoshi Takamasu, Kyohei Ishikawa, Tomihiko Takamura, Muzheng Xiao, Satoru Takahashi

机械与车辆学院

The University of Tokyo

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

源语言	英语
主期刊名	Proceedings - ASPE/ASPEN Summer Topical Meeting
主期刊副标题	Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces
出版商	American Society for Precision Engineering, ASPE
页	121-125
页数	5
ISBN（印刷版）	9781887706650
出版状态	已出版 - 2014
活动	Joint Meeting of the American Society for Precision Engineering (ASPE) and the Asian Society for Precision Engineering (ASPEN) on Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces - 2014 Summer Topical Meeting - Kohala Coast, HI, 美国期限: 26 6月 2014 → 27 6月 2014

出版系列

姓名	Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces

会议

会议	Joint Meeting of the American Society for Precision Engineering (ASPE) and the Asian Society for Precision Engineering (ASPEN) on Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces - 2014 Summer Topical Meeting
国家/地区	美国
市	Kohala Coast, HI
时期	26/06/14 → 27/06/14

其它文件与链接

链接到 Scopus 的出版物

引用此

Takamasu, K., Ishikawa, K., Takamura, T., Xiao, M., & Takahashi, S. (2014). Nanometer profile measurement of aspheric surface using scanning deflectometry and rotating autocollimator: Self-calibration method of autocollimator. 在 Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces (页码 121-125). (Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces). American Society for Precision Engineering, ASPE.

Takamasu, Kiyoshi ; Ishikawa, Kyohei ; Takamura, Tomihiko 等. / Nanometer profile measurement of aspheric surface using scanning deflectometry and rotating autocollimator : Self-calibration method of autocollimator. Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces. American Society for Precision Engineering, ASPE, 2014. 页码 121-125 (Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces).

@inproceedings{eb9d497e8df1430786a22d1c670fdd14,

title = "Nanometer profile measurement of aspheric surface using scanning deflectometry and rotating autocollimator: Self-calibration method of autocollimator",

author = "Kiyoshi Takamasu and Kyohei Ishikawa and Tomihiko Takamura and Muzheng Xiao and Satoru Takahashi",

year = "2014",

language = "English",

isbn = "9781887706650",

series = "Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces",

publisher = "American Society for Precision Engineering, ASPE",

pages = "121--125",

booktitle = "Proceedings - ASPE/ASPEN Summer Topical Meeting",

note = "Joint Meeting of the American Society for Precision Engineering (ASPE) and the Asian Society for Precision Engineering (ASPEN) on Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces - 2014 Summer Topical Meeting ; Conference date: 26-06-2014 Through 27-06-2014",

}

Takamasu, K, Ishikawa, K, Takamura, T, Xiao, M & Takahashi, S 2014, Nanometer profile measurement of aspheric surface using scanning deflectometry and rotating autocollimator: Self-calibration method of autocollimator. 在 Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces. Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces, American Society for Precision Engineering, ASPE, 页码 121-125, Joint Meeting of the American Society for Precision Engineering (ASPE) and the Asian Society for Precision Engineering (ASPEN) on Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces - 2014 Summer Topical Meeting, Kohala Coast, HI, 美国, 26/06/14.

Nanometer profile measurement of aspheric surface using scanning deflectometry and rotating autocollimator: Self-calibration method of autocollimator. / Takamasu, Kiyoshi; Ishikawa, Kyohei; Takamura, Tomihiko 等.
Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces. American Society for Precision Engineering, ASPE, 2014. 页码 121-125 (Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces).

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

TY - GEN

T1 - Nanometer profile measurement of aspheric surface using scanning deflectometry and rotating autocollimator

T2 - Joint Meeting of the American Society for Precision Engineering (ASPE) and the Asian Society for Precision Engineering (ASPEN) on Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces - 2014 Summer Topical Meeting

AU - Takamasu, Kiyoshi

AU - Ishikawa, Kyohei

AU - Takamura, Tomihiko

AU - Xiao, Muzheng

AU - Takahashi, Satoru

PY - 2014

Y1 - 2014

UR - http://www.scopus.com/inward/record.url?scp=84907068117&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84907068117

SN - 9781887706650

T3 - Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces

SP - 121

EP - 125

BT - Proceedings - ASPE/ASPEN Summer Topical Meeting

PB - American Society for Precision Engineering, ASPE

Y2 - 26 June 2014 through 27 June 2014

ER -

Takamasu K, Ishikawa K, Takamura T, Xiao M, Takahashi S. Nanometer profile measurement of aspheric surface using scanning deflectometry and rotating autocollimator: Self-calibration method of autocollimator. 在 Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces. American Society for Precision Engineering, ASPE. 2014. 页码 121-125. (Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces).