TY - GEN
T1 - Multiple reflection error analysis for planar near field measurement in time domain
AU - Cao, Meng
AU - Xue, Zhenghui
AU - Ren, Wu
AU - Li, Weiming
AU - Zhu, Ruoqing
AU - Cai, Hongwei
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2017/1/12
Y1 - 2017/1/12
N2 - Multiple reflection signals between the probe and the antenna is always ignored in frequency domain near field measurement, which can be reduced by technique such as time gate in the time domain near field measurement sometimes. There are few articles to study about influence of the multiple reflection error affecting the result of the test for it is difficult to determine multiple reflection signals in the frequency domain. In this paper multiple reflection signals is studied by analyze the signals in the port of antenna under test (AUT). The multiple reflection signals with different probe in different position are shown, and then influence of each parameter of probe is presented.
AB - Multiple reflection signals between the probe and the antenna is always ignored in frequency domain near field measurement, which can be reduced by technique such as time gate in the time domain near field measurement sometimes. There are few articles to study about influence of the multiple reflection error affecting the result of the test for it is difficult to determine multiple reflection signals in the frequency domain. In this paper multiple reflection signals is studied by analyze the signals in the port of antenna under test (AUT). The multiple reflection signals with different probe in different position are shown, and then influence of each parameter of probe is presented.
UR - http://www.scopus.com/inward/record.url?scp=85013167914&partnerID=8YFLogxK
U2 - 10.1109/CAMA.2016.7815812
DO - 10.1109/CAMA.2016.7815812
M3 - Conference contribution
AN - SCOPUS:85013167914
T3 - 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016
BT - 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016
Y2 - 23 October 2016 through 27 October 2016
ER -