Moiré interferometry applied to ferroelectric ceramics

Z. W. Liu, D. N. Fang*, H. M. Xie, Q. D. Bing, S. Li, F. L. Dai

*此作品的通讯作者

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摘要

This paper introduces how to in situ observe fracture behavior around a crack tip in ferroelectric ceramics under combined electromechanical loading by use of a moiré interferometry technique. The deformation field induced by electric field and stress concentration near the crack tip in three-points bending experiments was measured. By analysing the moiré interferometry images it is found that under a constant mechanical load, an electrical field has no effect on crack extension in the case that the directions of the poling, electric field and crack extension are perpendicular to each other. When the poling direction is parallel to the crack extension direction and perpendicular to the electric field, strain decreases faster than values predicted by the theoretical analysis as the distance away from the crack tip increases. In addition, as the electric field raises the strain near the crack tip increases, and the strain concentration phenomena becomes more significant.

源语言英语
页(从-至)425-433
页数9
期刊Proceedings of SPIE - The International Society for Optical Engineering
5058
DOI
出版状态已出版 - 2003
已对外发布
活动Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002 - Beijing, 中国
期限: 3 9月 20026 9月 2002

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引用此

Liu, Z. W., Fang, D. N., Xie, H. M., Bing, Q. D., Li, S., & Dai, F. L. (2003). Moiré interferometry applied to ferroelectric ceramics. Proceedings of SPIE - The International Society for Optical Engineering, 5058, 425-433. https://doi.org/10.1117/12.509794