Modeling Atomic-Scale Electrical Contact Quality Across Two-Dimensional Interfaces

Aisheng Song, Ruoyu Shi, Hongliang Lu, Lei Gao, Qunyang Li, Hui Guo, Yanmin Liu, Jie Zhang, Yuan Ma, Xin Tang, Shixuan Du, Xin Li, Xiao Liu, Yuan Zhong Hu, Hong Jun Gao, Jianbin Luo, Tian Bao Ma^*