Miniature radio frequency ion trap mass spectrometry

Jeffrey D. Maas, Wei Xu, Paul Hendricks, William J. Chappell

科研成果: 书/报告/会议事项章节会议稿件同行评审

3 引用 (Scopus)

摘要

RF ion traps are useful in chemical analysis and have added benefits when scaled to smaller dimensions. For a miniature ion trap it is ideal to be able to predict the performance of the ion trap prior to fabrication in order to save time and optimize parameters. We have developed both the simulation and fabrication of scaled ion traps. The simulation tool allows us to model miniature ion traps in order to predict how the frequency and amplitude of the RF voltage could be scaled in order to optimize the performance of the ion trap. We demonstrate the performance of a scaled ion trap array fabricated through the integration of stereolithography on circuit board and compare its performance with our ion trajectory simulator.

源语言英语
主期刊名2010 IEEE MTT-S International Microwave Symposium, MTT 2010
1636-1639
页数4
DOI
出版状态已出版 - 2010
已对外发布
活动2010 IEEE MTT-S International Microwave Symposium, MTT 2010 - Anaheim, CA, 美国
期限: 23 5月 201028 5月 2010

出版系列

姓名IEEE MTT-S International Microwave Symposium Digest
ISSN(印刷版)0149-645X

会议

会议2010 IEEE MTT-S International Microwave Symposium, MTT 2010
国家/地区美国
Anaheim, CA
时期23/05/1028/05/10

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