Investigation of defect clusters in ion-irradiated Ni and NiCo using diffuse X-ray scattering and electron microscopy

Raina J. Olsen*, Ke Jin, Chenyang Lu, Laurent K. Beland, Lumin Wang, Hongbin Bei, Eliot D. Specht, Bennett C. Larson

*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

28 引用 （Scopus）

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Material Science

Engineering

Physics