Intrinsic current-voltage properties of nanowires with four-probe scanning tunneling microscopy: A conductance transition of ZnO nanowire

X. Lin, X. B. He, T. Z. Yang, W. Guo, D. X. Shi, H. J. Gao*, D. D.D. Ma, S. T. Lee, F. Liu, X. C. Xie

*此作品的通讯作者

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Material Science