Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements

Xing Wang*, Constantinos Hatzoglou, Brian Sneed, Zhe Fan, Wei Guo, Ke Jin, Di Chen, Hongbin Bei, Yongqiang Wang, William J. Weber, Yanwen Zhang, Baptiste Gault, Karren L. More, Francois Vurpillot, Jonathan D. Poplawsky

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

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Material Science