High precision calibration method of laser projection turntable

Yuzhang Yan, Ming Liu*, Mei Hui, Yuejin Zhao, Liquan Dong, Lingqin Kong

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

1 引用 (Scopus)

摘要

Camera calibration is the bridge between 2D image and 3D world and is the basis of 3D stereo vision. Camera calibration can establish the mapping between the real 3D coordinates of space points and the corresponding 2D coordinates of the image. It will directly affect the final effect of 3D reconstruction or the positioning accuracy of 3D coordinates of space points. So accurate camera calibration technology is an essential step in 3D reconstruction, target spatial localization and even all machine visual systems, which has very important research significance. However, in some special scenarios, traditional calibration methods are difficult to use because of the long distance or difficulty in entering the scenario. To solve this problem, we propose a calibration method based on laser projection turntable. The camera shoots the laser projection lattice to determine the corresponding relationship between the pixel coordinates and the motor code amount, which is put into the calibration model to complete the camera calibration. Before camera calibration, the laser projection turntable must be calibrated with high accuracy. Firstly, the initial pose of the laser projection turntable is estimated. We accurately obtain the 3D coordinates of the calibration points with the help of the total station, and the pose information of the laser projection turntable is obtained by rigid body transformation, and then the corresponding relationship between the projection point and the code amount of the motor is obtained. Then, the least square method is used to optimize the estimation to improve the calibration accuracy. The experimental results show that the method meets the requirement of calibration accuracy and has practical application value, and the implementation of the subsequent camera calibration method can be continued.

源语言英语
主期刊名Optical Metrology and Inspection for Industrial Applications IX
编辑Sen Han, Sen Han, Gerd Ehret, Benyong Chen
出版商SPIE
ISBN(电子版)9781510657045
DOI
出版状态已出版 - 2022
活动Optical Metrology and Inspection for Industrial Applications IX 2022 - Virtual, Online, 中国
期限: 5 12月 202211 12月 2022

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
12319
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Optical Metrology and Inspection for Industrial Applications IX 2022
国家/地区中国
Virtual, Online
时期5/12/2211/12/22

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