Hardware implement of high resolution light field microscopy

Xiaoli Jiang, Yao Hu*, Zhuo Chen

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Microscope is the primary scientific instrument in many laboratories. Nowadays, with the development of science and technology, requirements on the performance of microscopic imaging are growing rapidly. Light field microscopy (LFM) is an effective approach of obtaining three-dimensional (3D) information. However, the LFM compromises the spatial resolution of image. To solve this problem, this paper proposes a new method by combining LFM with Fourier ptychographic (FP) algorithm, which iteratively stitches together a number of variably illuminated, low-resolution intensity images in Fourier space to produce a wide-field, high-resolution complex sample image. The hardware implement of the system is mainly introduced, which contains the image system and the illumination system. This system uses epi-illumination for non-transparent sample image. To verify the capability of this system, experiments have been done. Firstly, a 150 μm size micro-lens array was used to image without FP algorithm. Secondly, FP algorithm was added to the experiments. Preliminary results showed the potential of the method.

源语言英语
主期刊名AOPC 2017
主期刊副标题3D Measurement Technology for Intelligent Manufacturing
编辑Anand Krishna Asundi, Huijie Zhao, Wolfgang Osten
出版商SPIE
ISBN(电子版)9781510613973
DOI
出版状态已出版 - 2017
活动Applied Optics and Photonics China: 3D Measurement Technology for Intelligent Manufacturing, AOPC 2017 - Beijing, 中国
期限: 4 6月 20176 6月 2017

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10458
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Applied Optics and Photonics China: 3D Measurement Technology for Intelligent Manufacturing, AOPC 2017
国家/地区中国
Beijing
时期4/06/176/06/17

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