Fractional Fourier ridges for demodulation of interferograms with quadratic phase

Jin Min Wu, Ming Feng Lu*, Chen Chen Ji, Pei Hang Li, Feng Zhang, Ran Tao

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

2 引用 (Scopus)

摘要

A method based on the fractional Fourier ridges for accurate phase demodulation of a single interferogram with quadratic phase is presented. The interferograms being analyzed may contain circular, elliptic or astigmatic fringes. In signal processing field, such interferograms can be called 2-D chirp-type signals. Since the fractional Fourier transform (FRFT) of a chirp signal is a function under the matched angle that is determined by chirp rates of the signal, so the method can be used to match the multiple chirp rates in chirp-type signals with multiple chirp components. In this work, the FRFT of all row (column) signals are firstly calculated, and the ridge of the FRFT amplitude of each row (column) signal in FRFT domain is recorded. Repeat the above process for each angle of a searching range. Then a ridge tracking approach is employed to determine the matched angle, which can be used to calculate the coefficient of the square term of row (column) coordinates. Moreover, under the matched angle, the ridge of the FRFT amplitude of each row (column) signal all lie on a straight line. The slope and constant term of the line can be used to calculate the coefficient of the linear term of row (column) coordinates and the coefficient of cross term, respectively. The same procedures are implemented to all column (row) signals to determine the coefficients of the square and liner term of column (row) coordinates. According to the obtained coefficients, the phase of the fringe pattern can be constructed without phase unwrapping operation. Furthermore, the present procedure is also capable of analysis of interferograms with or without circularly symmetry fringe distribution instead of using complex and time consuming algorithms for recovering phase from fringe patterns with closed fringes. Finally, the method is tested in simulated and real data.

源语言英语
主期刊名Modeling Aspects in Optical Metrology VII
编辑Bernd Bodermann, Karsten Frenner
出版商SPIE
ISBN(电子版)9781510627932
DOI
出版状态已出版 - 2019
活动Modeling Aspects in Optical Metrology VII 2019 - Munich, 德国
期限: 24 6月 201926 6月 2019

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
11057
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Modeling Aspects in Optical Metrology VII 2019
国家/地区德国
Munich
时期24/06/1926/06/19

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