Flexoelectricity induced increase of critical thickness in epitaxial ferroelectric thin films

Hao Zhou, Jiawang Hong, Yihui Zhang, Faxin Li, Yongmao Pei*, Daining Fang

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

32 引用 (Scopus)

摘要

Flexoelectricity describes the coupling between polarization and strain/stress gradients in insulating crystals. In this paper, using the Landau-Ginsburg-Devonshire phenomenological approach, we found that flexoelectricity could increase the theoretical critical thickness in epitaxial BaTiO 3 thin films, below which the switchable spontaneous polarization vanishes. This increase is remarkable in tensile films while trivial in compressive films due to the electrostriction caused decrease of potential barrier, which can be easily destroyed by the flexoelectricity, between the ferroelectric state and the paraelectric state in tensile films. In addition, the films are still in a uni-polar state even below the critical thickness due to the flexoelectric effect.

源语言英语
页(从-至)3377-3381
页数5
期刊Physica B: Condensed Matter
407
17
DOI
出版状态已出版 - 1 9月 2012
已对外发布

指纹

探究 'Flexoelectricity induced increase of critical thickness in epitaxial ferroelectric thin films' 的科研主题。它们共同构成独一无二的指纹。

引用此