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Fast aerial image model for EUV lithography using the adjoint fully convolutional network
Jiaxin Lin, Lisong Dong, Taian Fan,
Xu Ma
, Yayi Wei
光电学院
CAS - Institute of Microelectronics
University of Chinese Academy of Sciences
Guangdong Greater Bay Area Applied Research Institute of Integrated Circuit and Systems
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探究 'Fast aerial image model for EUV lithography using the adjoint fully convolutional network' 的科研主题。它们共同构成独一无二的指纹。
分类
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按字母排序
Engineering
Extreme-Ultraviolet Lithography
100%
Image Model
100%
Aerial Image
100%
Data Path
50%
Tasks
25%
Lithography
25%
Computational Efficiency
25%
Deep Learning
25%
Real Part
25%
Imaginary Part
25%
Oblique Incidence
25%
Earth and Planetary Sciences
Lithography
100%
Adjoints
100%