摘要
We report the thickness dependence of critical current density (Jc) in YBa2Cu3O7-x (YBCO) films with BaZrO3 (BZO) and Y2O3 additions grown on single crystal LaAlO3 substrates by metalorganic deposition using trifluoroacetates (TFA-MOD). Comparing with pure YBCO films, the Jc of BZO/Y2O3-doped YBCO films was significantly enhanced. It was also found that with the increase of the thickness of YBCO film from 0.25 μm to 1.5 μm, the Ic of BZO/Y2O3-doped YBCO film increased from 130 A/cm to 250 A/cm and yet Jc of YBCO film decreased from 6.5 MA/cm2 to 2.5 M A/cm2. The thick BZO/Y2O3-doped MOD-YBCO film showed lower Jc, which is mainly attributed to the formation of a-axis grains and pores.
源语言 | 英语 |
---|---|
文章编号 | 057401 |
期刊 | Chinese Physics B |
卷 | 24 |
期 | 5 |
DOI | |
出版状态 | 已出版 - 1 5月 2015 |
已对外发布 | 是 |