Direct atomic-scale visualization of the 90° domain walls and their migrations in Hf0.5Zr0.5O2 ferroelectric thin films

Yunzhe Zheng, Yuke Zhang, Tianjiao Xin, Yilin Xu, Shuangquan Qu, Junding Zheng, Zhaomeng Gao, Qilan Zhong, Yiwei Wang, Xiaoyu Feng, Yonghui Zheng, Yan Cheng*, Ruiwen Shao, Fang Lin, Xiaoling Lin, He Tian, Rong Huang, Chungang Duan, Hangbing Lyu*

*此作品的通讯作者

科研成果: 期刊稿件 › 文章 › 同行评审

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Material Science