摘要
The TEM nano-moire method is first applied to measure the mechanical properties of single-walled nanotubes. The nano-moire method is an experimental technique, which allows direct measurement to nanoscopic mechanical parameters. The moire pattern is generated by the interference between scanning lines in monitor and transmission electron microscopy (TEM) image of self-assembled SWNTs bundles. The principle of the technique is described in detail. The SWNT bundles with different diameters produced by arc-discharge method are used to generate moire patterns. The TEM nano-moire method is successfully used to measure the residual deformation of an individual nanotube with diameter of 1.0 nm in a curved SWNT bundle. The results demonstrate the feasibility of this technique.
源语言 | 英语 |
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页(从-至) | 515-517 |
页数 | 3 |
期刊 | Guangxue Jishu/Optical Technique |
卷 | 29 |
期 | 5 |
出版状态 | 已出版 - 9月 2003 |
已对外发布 | 是 |