Defect Modeling During the SLM Process for Manufacturing Microwave Devices

Shuai Li*, Xiue Bao*, Giovanni Gugliandolo, Haoyun Yuan*, Jinkai Li, Linxiang Shao*, Minghe Du, Nicola Donato, Zlatica Marinkovic, Giovanni Crupi, Lili Fang*, Liming Si*, Houjun Sun*

*此作品的通讯作者

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

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Material Science