Defect detection based on a lensless reflective point diffraction interferometer

Wenhua Zhu, Lei Chen*, Yiming Liu, Yun Ma, Donghui Zheng, Zhigang Han, Jinpeng Li

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

4 引用 (Scopus)

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Engineering

Physics

Material Science