Crystal Growth and Characterization of ZrSiS-Type Topological Dirac Semimetals

Material Science

• Semimetals 100%
• Crystal Growth 100%
• X-Ray Diffraction 50%
• Carrier Concentration 50%
• Electronic Property 50%
• Electrical Resistivity 50%
• Magnetoresistance 50%
• Diffraction Measurement 50%

Chemistry

• Metalloid 100%
• Crystal Growth 100%
• X-Ray Diffraction 50%
• Structure 50%
• Electronic Property 50%
• Magnetoresistance 50%