TY - GEN
T1 - Classification and Verification of Surface Anisotropic Reflectance Characteristics
AU - Wang, Chenxia
AU - Jiao, Ziti
AU - Zhang, Hu
AU - Zhang, Xiaoning
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - The surface reflectance anisotropy is usually described by bidirectional reflectance distribution function (BRDF), and the BRDF archetypes extracted based on the Anisotropic Flat Index (AFX) have been used as the prior reflectance anisotropy knowledge of quantitative inversion. In this study, we introduce a new index, i.e., the Perpendicular Anisotropic Flat Index (PAFX), based on the AFX in a prior study, to refine the BRDF classification of the land surface. Based on the MODIS BRDF parameter products sampled at global intervals over multiple land cover types in 2015, we used AFX and PAFX as classification indicators to divide MODIS BRDF parameter space into some orthogonal clusters through use of the ISODATA (Iterative Self organizing data Analysis technique) Clustering Algorithm. As a case study, the MODIS BRDF parameters are divided into three classes by using the AFX and PAFX, respectively, in an orthogonal way, and therefore a total of nine cluster classes of BRDF parameters are generated, correspondingly generating nine BRDF archetypes. We use the average BRDF fitting error, algorithm complexity and classification accuracy to evaluate this classification method for classifying BRDF parameters, showing that the difference within the BRDF archetypes class is significantly reduced after the introduction of PAFX (RMSE = 0.0083) compared with only using AFX (RMSE = 0.0139), and the error for fitting all BRDF shapes with the average BRDF shape, i.e., the BRDF archetype presents a V-shaped trend as functions of AFX and PAFX, indicating an optimized minimum. In general, jointing the AFX and PAFX has improved the classification accuracy of the MODIS BRDF parameter space and is expected a further application in near future.
AB - The surface reflectance anisotropy is usually described by bidirectional reflectance distribution function (BRDF), and the BRDF archetypes extracted based on the Anisotropic Flat Index (AFX) have been used as the prior reflectance anisotropy knowledge of quantitative inversion. In this study, we introduce a new index, i.e., the Perpendicular Anisotropic Flat Index (PAFX), based on the AFX in a prior study, to refine the BRDF classification of the land surface. Based on the MODIS BRDF parameter products sampled at global intervals over multiple land cover types in 2015, we used AFX and PAFX as classification indicators to divide MODIS BRDF parameter space into some orthogonal clusters through use of the ISODATA (Iterative Self organizing data Analysis technique) Clustering Algorithm. As a case study, the MODIS BRDF parameters are divided into three classes by using the AFX and PAFX, respectively, in an orthogonal way, and therefore a total of nine cluster classes of BRDF parameters are generated, correspondingly generating nine BRDF archetypes. We use the average BRDF fitting error, algorithm complexity and classification accuracy to evaluate this classification method for classifying BRDF parameters, showing that the difference within the BRDF archetypes class is significantly reduced after the introduction of PAFX (RMSE = 0.0083) compared with only using AFX (RMSE = 0.0139), and the error for fitting all BRDF shapes with the average BRDF shape, i.e., the BRDF archetype presents a V-shaped trend as functions of AFX and PAFX, indicating an optimized minimum. In general, jointing the AFX and PAFX has improved the classification accuracy of the MODIS BRDF parameter space and is expected a further application in near future.
KW - Anisotropic Flat Index (AFX)
KW - BRDF
KW - BRDF archetypes
KW - MODIS
KW - Perpendicular Anisotropic Flat Index (PAFX)
KW - classification
UR - http://www.scopus.com/inward/record.url?scp=85140408922&partnerID=8YFLogxK
U2 - 10.1109/IGARSS46834.2022.9884490
DO - 10.1109/IGARSS46834.2022.9884490
M3 - Conference contribution
AN - SCOPUS:85140408922
T3 - International Geoscience and Remote Sensing Symposium (IGARSS)
SP - 2698
EP - 2701
BT - IGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2022
Y2 - 17 July 2022 through 22 July 2022
ER -